气候变化领域集成服务门户(CCPortal): Revisiting lifetimes from transient electrical characterization of thin film solar cells; A capacitive concern evaluated for silicon, organic and perovskite devices

CCPortal

DOI	10.1039/c7ee03155f
	Revisiting lifetimes from transient electrical characterization of thin film solar cells; A capacitive concern evaluated for silicon, organic and perovskite devices
	Kiermasch D.; Baumann A.; Fischer M.; Dyakonov V.; Tvingstedt K.
发表日期	2018
ISSN	17545692
起始页码	629
结束页码	640
卷号	11 期号:3
英文摘要	The lifetime of photogenerated charge carriers is one of the most important parameters in solar cells, as it rules the recombination rate that defines the open circuit voltage and the required minimum extraction time. It is therefore also one of the most discussed factors in all photovoltaic research fields. Lifetime evaluation of solar cells is frequently conducted via both optical and electrical means with the purpose of obtaining a deeper understanding of the dominant performance limiting recombination mechanisms. In many earlier recombination designations, performed via transient electrical means in novel thin film solar cells, the lifetime has been observed to be a decaying exponential function of the open circuit voltage. In this work we re-evaluate these previously assigned lifetimes as often being severely influenced by capacitive decay rates of spatially separated charge carriers. These "lifetimes" have thus very little in common with lifetimes relevant under steady state operational conditions of the solar cell. We show that the problem of lifetime determination via electrical means arises from that the relaxation of such charges, being associated with quasi-static capacitances of geometric type or from space-charge regions in the device, is also a decaying exponential function of the instantaneous open circuit voltage. This misconception hence also explains the often observed large discrepancy between optically and electrically determined lifetimes. We finally provide a simple expression outlining under what conditions relevant bulk recombination lifetimes are electrically accessible in thin film solar cells. © The Royal Society of Chemistry 2018.
英文关键词	Capacitance; Charge carriers; Decay (organic); Electric variables measurement; Exponential functions; Function evaluation; Open circuit voltage; Perovskite; Perovskite solar cells; Power quality; Silicon solar cells; Solar cells; Thin film solar cells; Thin films; Transients; Voltage measurement; Decaying exponential functions; Electrical characterization; Lifetime evaluation; Operational conditions; Photogenerated charge carriers; Quasi-static capacitance; Recombination mechanisms; Space charge regions; Thin film circuits; electrical power; equipment; fuel cell; operations technology; performance assessment; perovskite; photovoltaic system; silicon; steady-state equilibrium
语种	英语
来源期刊	Energy & Environmental Science
文献类型	期刊论文
条目标识符	http://gcip.llas.ac.cn/handle/2XKMVOVA/190290
作者单位	Experimental Physics VI, Julius Maximillian University of Würzburg, Würzburg, 97074, Germany; Bavarian Center for Applied Energy Research, Würzburg, 97074, Germany
推荐引用方式 GB/T 7714	Kiermasch D.,Baumann A.,Fischer M.,et al. Revisiting lifetimes from transient electrical characterization of thin film solar cells; A capacitive concern evaluated for silicon, organic and perovskite devices[J],2018,11(3).
APA	Kiermasch D.,Baumann A.,Fischer M.,Dyakonov V.,&Tvingstedt K..(2018).Revisiting lifetimes from transient electrical characterization of thin film solar cells; A capacitive concern evaluated for silicon, organic and perovskite devices.Energy & Environmental Science,11(3).
MLA	Kiermasch D.,et al."Revisiting lifetimes from transient electrical characterization of thin film solar cells; A capacitive concern evaluated for silicon, organic and perovskite devices".Energy & Environmental Science 11.3(2018).