气候变化领域集成服务门户(CCPortal): Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy

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DOI	10.1016/j.micron.2016.06.003
	Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy
	Gu, Yaxu; Jie, Wanqi; Rong, Caicai; Xu, Lingyan; Xu, Yadong; Lv, Haoyan; Shen, Hao; Du, Guanghua; Guo, Na; Guo, Rongrong; Zha, Gangqiang; Wang, Tao; Xi, Shouzhi
发表日期	2016
ISSN	0968-4328
卷号	88
英文摘要	The influence of damage induced by 2 MeV protons on CdZnTe radiation detectors is investigated using ion beam induced charge (IBIC) microscopy. Charge collection efficiency (CCE) in irradiated region is found to be degraded above a fluence of 3.3 x 10(11) p/cm(2) and the energy spectrum is severely deteriorated with increasing fluence. Moreover, CCE maps obtained under the applied biases from 50 V to 400 V suggests that local radiation damage results in significant degradation of CCE uniformity, especially under low bias, i. e., 50 V and 100 V. The CCE nonuniformity induced by local radiation damage, however, can be greatly improved by increasing the detector applied bias. This bias-dependent effect of 2 MeV proton induced radiation damage in CdZnTe detectors is attributed to the interaction of electron cloud and radiation-induced displacement defects. (C) 2016 Elsevier Ltd. All rights reserved.
关键词	Proton Radiation damage Ion beam induced charge microscopy CdZnTe Bias dependent
学科领域	Microscopy
语种	英语
WOS研究方向	Microscopy
来源期刊	MICRON
来源机构	中国科学院西北生态环境资源研究院
文献类型	期刊论文
条目标识符	http://gcip.llas.ac.cn/handle/2XKMVOVA/111865
作者单位	Northwestern Polytech Univ, Sch Mat Sci & Engn, State Key Lab Solidificat Proc, Xian 710072, Peoples R China
推荐引用方式 GB/T 7714	Gu, Yaxu,Jie, Wanqi,Rong, Caicai,et al. Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy[J]. 中国科学院西北生态环境资源研究院,2016,88.
APA	Gu, Yaxu.,Jie, Wanqi.,Rong, Caicai.,Xu, Lingyan.,Xu, Yadong.,...&Xi, Shouzhi.(2016).Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy.MICRON,88.
MLA	Gu, Yaxu,et al."Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy".MICRON 88(2016).